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LCR-T5 finished transistor tester + diode + resistor + capacitor inductance + ESR + SCR + mos

Product ID: obd4s-3572     
Sale: US$ 55.00
Market Price: US$ 60.00
Tailoring Time:8-12 Calendar Days
Shipping Time:2-8 Calendar Days

Description & Specs

LCR-T5 finished transistor tester: Resistor Capacitor + + + inductance capacitor ESR + unidirectional, bidirectional thyristor + light-emitting diodes 
usb can supply, you can charge the internal lithium battery, power management has been on the board! Ease of insertion usb charging port, 
Weight: 96g or so. 
* Add boot voltage detection function 
* Automatic detection of NPN and PNP transistors, N-channel and P-channel MOSFET, diodes (including dual diode), thyristors, transistors, resistors and capacitors and other components, 
* Automatic test out the pin element and displayed on the LCD 
* Can be detected to determine the emitter forward bias voltage of the transistor Transistor, MOSFET protection diode and the amplification factor of the base 
* Measure the gate threshold voltage and gate capacitance of the MOSFET 
LCD monitors use 12864 * (128 * 64 characters) 
* High test speed, valid component test: 2 seconds (except in the larger capacitor of large capacitance measurement also takes a long time, the measured time of one minute is normal) 
* One button operation, power-on test, get a key. 
* Power consumption off mode: less than 20 nA of 
* Auto power off function to avoid unnecessary waste, saving battery power, improved battery life. 
******* Following functions for M8 and M168 ​​Premium Edition version differs **** please choose according to their needs ********* 
1. ATmega328 microcontroller. 
2.1284 LCD display results. 
3. One button operation, automatic power off. 
4. Shutdown current is only 20nA, support battery operation. 
5. ATmega328 in sleep mode when there is no measurement to reduce power consumption. 
6. Automatic detection PNP and NPN bipolar transistor, N, P-channel MOSFET, JFET, diodes, dual diode, thyristor SCR. 
7. Automatic detection pin layout. 
8. Current amplification factor measurement of the bipolar transistor and the threshold voltage emitter junction. 
9. Darlington transistor may be identified by the amplification factor of the high threshold voltage and high current. 
10. For bipolar transistor, MOSFET protection diode testing. 
11. Measuring the threshold voltage of the MOSFET and the gate capacitance. 
12. Supports two resistance measurements and symbols show the highest four numbers and units. Both ends of the resistor symbol is shown connected to the tester probes number (1-3). Therefore, the potential can also be measured. If the potentiometer is adjusted to its end, the tester can not distinguish the two ends of the pin and the middle. 
13. Resistance measurement resolution is 0.1 ohm, the highest measured value 50M ohms. 
14. Can be detected and measured with a capacitor. Maximum four digits and units. Value can be from 25pf (8MHz clock, 50pF @ 1MHz clock) to 100mF. Resolution up to 1 pF (@ 8MHz clock). 
15. For the above values ​​can 2UF capacitor equivalent series resistance (ESR) capacitor value measurements. Resolution of 0.01 ohms and a two-digit numeric display. 
16. Two diodes can display symbols in the right direction. Further, the display forward voltage drop. 
17. LED detection diode forward voltage drop is much higher than normal. Dual LED detected as double diodes. 
18. Zener diode can be detected if the reverse breakdown voltage is less than 4.5V. This is displayed as two diodes, can only be determined by the voltage. Diode symbol is the same around the probe, in this case you can 700mV threshold voltage near real identification diode anode! 
19 If more than three diode-type parts detection, failure to establish the number of diodes another message. This will only happen if the diode is connected to all three probes and at least one diode. In this case, you should only connect the two measuring probe and start again, one by one. 
20. Measuring a single diode reverse capacitance value. Bipolar transistors also can measure, if you connect the base and collector or emitter. 
Twenty one. Only one measurement to find full-bridge connection. 
Twenty two. Values ​​less than 25pf capacitor typically undetectable, but a diode in parallel with 25pf capacitor or at least parallel. In this case, you must subtract the part of the parallel capacitance values. 
Twenty three. Less than 2100 ohm resistor will measure inductance, if you have at least 16K ATMEGA flash. Range from 0:01 mH than 20H, but the accuracy is not good. Measurement results show only a single component connection. 
Twenty four. Testing time is about two seconds, only capacitance and inductance measurements will take a long time. 
25. Software can set the number of measurements before the power is automatically turned off. 
26. Built-in self-test function with selectable clock frequency of 50Hz signal to check the accuracy and waits for a call (ATmega168 and ATmega328). 
27. Optional internal resistance and zero offset calibration of measuring equipment self-test capability of the output port (ATmega168 and ATmega328). Need a 100nF to 20uF capacitor connected to the compensation between analog comparator pins 1 and 3 of the offset voltage. This can reduce the measurement error than 40uF capacitor. With the same internal calibration capacitor voltage internal reference voltage is found to adjust the reference measurement ADC gain. 
  If the test current exceeds the holding current, SCR and triac can be detected. But some current higher than the semiconductor SCR and triac tester can provide the trigger current. Available test current is only about 6mA!
Contact Information:
Skype: kathy-tool
Whatsapp:+86 13798243491

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